C. Vérove: search on Z-Library

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1

[IEEE Proceedings of the IEEE 2006 International Interconnect Technology Conference - Burlingame, CA (2006.06.5-2006.06.7)] 2006 International Interconnect Technology Conference - New etch challenges for the 65-nm technology node Low-k integration using An enhanced Trench First Hard Mask architecture

Posseme, N., Maurice, C., Brun, Ph., Oilier, E., Guillermet, M., Verove, C., Berger, T., Fox, T., Hinsinger, O.

Year:

2006

Language:

english

File:

PDF, 255 KB

english, 2006

2

Benefits of plasma treatments on critical dimension control and line width roughness transfer during gate patterning

Azarnouche, Laurent, Pargon, Erwine, Menguelti, Kevin, Fouchier, Marc, Joubert, Olivier, Gouraud, Pascal, Verove, Christophe

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2013

Language:

english

File:

PDF, 2.16 MB

english, 2013

3

Sténose de l’artère rénale révélée par une pré-éclampsie d’apparition précoce : une série de six cas

O. Pourrat, C. Vérove, F. Bridoux, D. Herpin, A. Séchet, F. Pierre

Journal:

La Revue de Médecine Interne

Year:

2012

Language:

french

File:

PDF, 61 KB

french, 2012

4

A Safe Bacterial Microsyringe for In Vivo Antigen Delivery and Immunotherapy

Le Gouëllec, Audrey, Chauchet, Xavier, Laurin, David, Aspord, Caroline, Verove, Julien, Wang, Yan, Genestet, Charlotte, Trocme, Candice, Ahmadi, Mitra, Martin, Sandrine, Broisat, Alexis, Cretin, Franç

Journal:

Molecular Therapy

Year:

2013

Language:

english

File:

PDF, 1001 KB

english, 2013

5

[IEEE 2010 IEEE International Interconnect Technology Conference - IITC - Burlingame, CA, USA (2010.06.6-2010.06.9)] 2010 IEEE International Interconnect Technology Conference - Etching process scalability and challenges for ULK materials

Chevolleau, T., Posseme, N., David, T., Bouyssou, R., Ducote, J., Bailly, F., Darnon, M., Kodadi, M. El, Besacier, M., Licitra, C., Guillermet, M., Ostrovsky, A., Verove, C., Joubert, O.

Year:

2010

Language:

english

File:

PDF, 1.63 MB

english, 2010

6

Unbiased line width roughness measurements with critical dimension scanning electron microscopy and critical dimension atomic force microscopy

Azarnouche, L., Pargon, E., Menguelti, K., Fouchier, M., Fuard, D., Gouraud, P., Verove, C., Joubert, O.

Journal:

Journal of Applied Physics

Year:

2012

Language:

english

File:

PDF, 1.31 MB

english, 2012

7

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Impact of ambient atmosphere on plasma-damaged porous low-k characterization

Darnon, M., Chevolleau, T., David, T., Posseme, N., Bouyssou, R., Hurand, R., Joubert, O., Licitra, C., Rochat, N., Bailly, F., Verove, C.

Year:

2011

Language:

english

File:

PDF, 241 KB

english, 2011

8

Plasma treatments to improve line-width roughness during gate patterning

Azarnouche, Laurent, Pargon, Erwine, Menguelti, Kevin, Fouchier, Marc, Brihoum, Mélisa, Ramos, Raphael, Joubert, Olivier, Gouraud, Pascal, Verove, Christophe

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2013

Language:

english

File:

PDF, 1.87 MB

english, 2013

9

Gammapathie monoclonale et insuffisance rénale : apparences trompeuses !

Colombo, A., Sibille, A., Mondon, R., Dosbaa, I., Labatut, D., Verove, C., Sechet, A., Moumas, E.

Journal:

Néphrologie & Thérapeutique

Year:

2015

Language:

french

File:

PDF, 83 KB

french, 2015

10

Optimization of CVD dielectric process to achieve reliable ultra low-k air gaps

Vincent Arnal, Joaquin Torres, Jean-Philippe Reynard, Philippe Gayet, Christophe Vérove, Marc Guillermet, Philippe Spinelli

Journal:

Microelectronic Engineering

Year:

2002

Language:

english

File:

PDF, 573 KB

english, 2002

11

Integration of fluorine-doped silicon oxide in copper pilot line for 0.12-μm technology

J.P Reynard, C Verove, E Sabouret, P Motte, B Descouts, C Chaton, J Michailos, K Barla

Journal:

Microelectronic Engineering

Year:

2002

Language:

english

File:

PDF, 854 KB

english, 2002

12

Résumés de thèse

Christophe Vérove, Francine Jérémie, Raùl Filipe Teixeira de Oliveira, Marie-Chantal Pons, Guillaume Pham, Olivier Toublan, Marine Oudot, Marc Brelot

Journal:

annals of telecommunications - annales des télécommunications

Year:

1999

File:

PDF, 340 KB

1999

13

Hilbert geometry for convex polygonal domains

Bruno Colbois, Constantin Vernicos, Patrick Verovic

Journal:

Journal of Geometry

Year:

2011

Language:

english

File:

PDF, 558 KB

english, 2011

14

Some smooth Finsler deformations of hyperbolic surfaces

Bruno Colbois, Florence Newberger, Patrick Verovic

Journal:

Annals of Global Analysis and Geometry

Year:

2009

Language:

english

File:

PDF, 694 KB

english, 2009

15

Hilbert Geometry for Strictly Convex Domains

Bruno Colbois, Patrick Verovic

Journal:

Geometriae Dedicata

Year:

2004

Language:

english

File:

PDF, 149 KB

english, 2004

16

Thrombose du sinus caverneux compliquant un TINU syndrome

C Vérove, P Roblot, A Ramassamy, J.M. Goujon, G Touchard, B Becq-Giraudon

Journal:

La Revue de Médecine Interne

Year:

1996

File:

PDF, 105 KB

1996

17

Hypertension rénovasculaire pendant la grossesse : à propos de deux cas

C Vérove, F Bridoux, O Pourrat, M Bauwens, G Touchard, D Patte

Journal:

La Revue de Médecine Interne

Year:

1998

File:

PDF, 122 KB

1998

18

Compared effects of random and one HLA semi-identical transfusions on alloimmunization and acute rejection episodes in first renal allograft recipients

C. Vérove, I. Jollet, T. Lobbedez, G. Dumont, A.M. Griveau, B. Hurault de Ligny, D. Alcalay, G. Touchard

Journal:

Transplantation Proceedings

Year:

1998

Language:

english

File:

PDF, 136 KB

english, 1998

19

Un amour de glomérulonéphrite extra-membraneuse

C. Debiais, M. Baron, A. Sechet, C. Verove, J.-M. Goujon, S. Milin, E. Moumas

Journal:

Néphrologie & Thérapeutique

Year:

2011

Language:

french

File:

PDF, 60 KB

french, 2011

20

Maladie de dépôts de chaîne lourde alpha : à propos d’une observation

C. Debiais, E. Moumas, C. Lacombe, M. Baron, A. Sechet, C. Vérove, J.-M. Goujon, J.-M. Gombert, F. Bridoux, G. Touchard

Journal:

Néphrologie & Thérapeutique

Year:

2011

Language:

french

File:

PDF, 55 KB

french, 2011

21

PP066. Renal artery stenosis revealed by an early-onset preeclampsia: A series of 6 cases

O. Pourrat, C. Verove, F. Bridoux, D. Herpin, A. Sechet, F. Pierre

Journal:

Pregnancy Hypertension: An International Journal of Women's Cardiovascular Health

Year:

2012

Language:

english

File:

PDF, 45 KB

english, 2012

22

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Advanced Etch Technology for Nanopatterning - Plasma treatment to improve linewidth roughness during gate patterning

Azarnouche, L., Pargon, E., Menguelti, K., Fouchier, M., Brihoum, M., Ramos, R., Joubert, O., Gouraud, P., Verove, C., Zhang, Ying

Year:

2012

Language:

english

File:

PDF, 1.34 MB

english, 2012

23

Two properties of volume growth entropy in Hilbert geometry

Colbois, Bruno, Verovic, Patrick

Journal:

Geometriae Dedicata

Year:

2014

Language:

english

File:

PDF, 398 KB

english, 2014

24

Cyclosporin Maintenance Monotherapy After Renal Transplantation

Touchard, Guy, Verove, Cathy, Bridoux, Frank, Bauwens, Marc

Journal:

Year:

1999

Language:

english

File:

PDF, 468 KB

english, 1999

25

Effect of the correction of metabolic acidosis on nutritional status in elderly patients with chronic renal failure

Verove, Cathy, Maisonneuve, Nathalie, El Azouzi, Abdelghani, Boldron, Amal, Azar, Raymond

Journal:

Journal of Renal Nutrition

Year:

2002

Language:

english

File:

PDF, 67 KB

english, 2002

26

[American Vacuum Soc 2000 5th International Symposium on Plasma Process-Induced Damage - Santa Clara, CA, USA (22-24 May 2000)] 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) - Electron-shading characterization in a HDP contact etching process using a patterned CHARM wafer

Carrere, J.-P., Poiroux, T., Lukaszek, W., Verove, C., Haond, M., Reimbold, G., Turban, G.

Year:

2000

Language:

english

File:

PDF, 378 KB

english, 2000

27

[IEEE IEEE 2000 International Interconnect Technology Conference - Burlingame, CA, USA (5-7 June 2000)] Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) - Copper dual damascene integration using organic low k material: construction architecture comparison

Morand, Y., Assous, M., Berruyer, P., Cochet, M., Demolliens, O., Fayolle, M., Louis, D., Passemard, G., Roman, A., Verove, C., Trouiller, Y.

Year:

2000

Language:

english

File:

PDF, 535 KB

english, 2000

28

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Demonstration of an extendable and industrial 300mm BEOL integration for the 65-mn technology node

Hinsinger, O., Fox, R., Sabouret, E., Goldberg, C., Verove, C., Besling, W., Brun, P., Josse, E., Monget, C., Belmont, O., Van Hassel, J., Sharma, B.C., Jacquemin, J.P., Vannier, P., Humbert, A., Bune

Year:

2004

Language:

english

File:

PDF, 256 KB

english, 2004

29

[IEEE IEEE 2000 International Interconnect Technology Conference - Burlingame, CA, USA (5-7 June 2000)] Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) - Dual damascene architectures evaluation for the 0.18 μm technology and below

Verove, C., Descouts, B., Gayet, P., Guillermet, M., Sabouret, E., Spinelli, E., Van der Vegt, E.

Year:

2000

Language:

english

File:

PDF, 511 KB

english, 2000

30

[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - In situ post etching treatment as a solution to improve defect density for porous low-k integration using metallic hard masks

Posseme, N., Bouyssou, R., Chevolleau, T., David, T., Arnal, V., Chhun, S., Monget, C., Richard, E., Galpin, D., Guillan, J., Arnaud, L., Roy, D., Guillermet, M., Ramard, J., Joubert, O., Verove, C.

Year:

2009

Language:

english

File:

PDF, 1.27 MB

english, 2009

31

Residue growth on metallic-hard mask after dielectric etching in fluorocarbon-based plasmas. I. Mechanisms

N. Posseme, T. Chevolleau, R. Bouyssou, T. David, V. Arnal, J. P. Barnes, C. Verove, O. Joubert

Year:

2010

Language:

english

File:

PDF, 1.41 MB

english, 2010

32

[IEEE Proceedings of the IEEE 2001 International Interconnect Technology Conference - Burlingame, CA, USA (2001.06.6-2001.06.6)] Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) - Integration of a 3 level Cu-SiO/sub 2/ air gap interconnect for sub 0.1 micron CMOS technologies

Arnal, V., Torres, J., Gayet, P., Gonella, R., Spinelli, P., Guillermet, M., Reynard, J.-P., Verove, C.

Year:

2001

Language:

english

File:

PDF, 268 KB

english, 2001

33

Residue growth on metallic hard mask after dielectric etching in fluorocarbon based plasmas. II. Solutions

Posseme, N., Bouyssou, R., Chevolleau, T., David, T., Arnal, V., Darnon, M., Brun, Ph., Verove, C., Joubert, O.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2011

Language:

english

File:

PDF, 772 KB

english, 2011

34

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Scatterometric Porosimetry for porous low-k patterns characterization

Hurand, R., Bouyssou, R., Darnon, M., Tiphine, C., Licitra, C., El-kodadi, M., Chevolleau, T., David, T., Posseme, N., Besacier, M., Schiavone, P., Bailly, F., Joubert, O., Verove, C.

Year:

2011

Language:

english

File:

PDF, 165 KB

english, 2011

35

ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Study of Porous SiOCH Patterning Using Metallic Hard Mask: Challenges and Solutions

Posseme, Nicolas, David, Thibaut, Chevolleau, Thierry, Darnon, Maxime, Bailly, Fanny, Bouyssou, Regis, Ducote, Julien, Chaabouni, Hamed, El Kodadi, Mohamed, Licitra, Christophe, Verove, Christophe, Jo

Year:

2011

Language:

english

File:

PDF, 2.76 MB

english, 2011

36

Hilbert domains that admit a quasi-isometric embedding into Euclidean space

Colbois, Bruno, Verovic, Patrick

Journal:

Advances in Geometry

Year:

2011

Language:

english

File:

PDF, 72 KB

english, 2011

37

Expanding Europe through Memory: The Shifting Content of the Ever-Salient Past

Verov ek, P. J.

Journal:

Millennium - Journal of International Studies

Year:

2015

Language:

english

File:

PDF, 138 KB

english, 2015

38

Fibromuscular dysplasia of the allograft renal artery with early post-operative dissection: successful treatment with intravascular stent insertion

Journal:

Nephrology Dialysis Transplantation

Year:

1999

Language:

english

File:

PDF, 84 KB

english, 1999

39

Rigidity of Hilbert metrics

Colbois, Bruno, Verovic, Patrick

Journal:

Bulletin of the Australian Mathematical Society

Year:

2002

Language:

english

File:

PDF, 554 KB

english, 2002

40

Problème de l'entropie minimale pour les métriques de Finsler

VEROVIC, PATRICK

Journal:

Ergodic Theory and Dynamical Systems

Year:

1999

File:

PDF, 152 KB

1999

41

Une cause rare de défaillance multiviscérale aiguë

Labatut, D., Debiais, C., Gauvin, E., Motard, C., Moumas, E., Colombo, A., Verove, C., Sechet, A., Goujon, J.M., Touchard, G.

Journal:

Néphrologie & Thérapeutique

Year:

2015

Language:

french

File:

PDF, 63 KB

french, 2015

42

Epoxidation of fatty acids and vegetable oils assisted by microwaves catalysed by a cation exchange resin

Freites Aguilera, Adriana, Tolvanen, Pasi, Heredia, Shuyana, Gonzalez Muñoz, Marta, Samson, Tina, Oger, Adrien, Verove, Antoine, Eränen, Kari, Leveneur, Sebastien, Mikkola, Jyri-Pekka, Salmi, Tapio Ol

Journal:

Industrial & Engineering Chemistry Research

Year:

2018

Language:

english

File:

PDF, 932 KB

english, 2018

43

Laplacian and spectral gap in regular Hilbert geometries

Barthelmé, Thomas, Colbois, Bruno, Crampon, Mickaël, Verovic, Patrick

Journal:

Tohoku Mathematical Journal

Year:

2014

Language:

english

File:

PDF, 552 KB

english, 2014

44

Injection of Pseudomonas aeruginosa Exo Toxins into Host Cells Can Be Modulated by Host Factors at the Level of Translocon Assembly and/or Activity

Verove, Julien, Bernarde, Cédric, Bohn, Yu-Sing Tammy, Boulay, François, Rabiet, Marie-Josèphe, Attree, Ina, Cretin, François, Soldati, Thierry

Journal:

Year:

2012

Language:

english

File:

PDF, 1.84 MB

english, 2012